Dataray光束质量分析，光斑分析，M2光束分析系统
美国 DataRay 公司提供激光光束分析仪器，对激光光束的光斑大小，形状和能量分布等参数进行全面的测试和分析；同时与个人电脑连接对分析的结果提供二维或三维的显示，并对分析的结果进行打印输出。适合各种各样的激光光束，帮助你对你的激光光束的品质提供一个量化的结果。
产品分为：
相机式光束质量分析仪（CCD式） Beam Profiling Cameras
狭缝扫描式光束质量分析仪 Slit Scan Beam Profilers
查看Dataray光束质量分析仪的选择向导
相机式光束质量分析仪（CCD式）
Beam Profiling Cameras
WinCamD系列
 WinCamD-UCD12 | WinCamD-UCD15 | WinCamD-UCD23 |
WinCamD-UHR | WinCamD-XHR |  WinCamD-FIR-HR |
 WinCamD-LCM |
BladeCam-HR和BladeCam-XHR系列
 BladeCam-XHR System-BladeCam-XHR | BladeCam-XHR-1310 System-BladeCam-XHR-1310 | BladeCam-XHR-UV System-BladeCam-XHR-UV |
BladeCam-XHR System-BladeCam-XHR | BladeCam-XHR-1310 System-BladeCam-XHR-1310 | BladeCam-XHR-UV System-BladeCam-XHR-UV |
TaperCamD-UCD12和TaperCamD20-15-UCD23系列
 TaperCamD-UCD12 System-TaperCamD-UCD12 | TaperCamD-UCD12-1310 System-TaperCamD-UCD12-1310 | TaperCamD-UCD12-NIR System-TaperCamD-UCD12-NIR |
 TaperCamD20-15-UCD23 System-TaperCamD20-15-UCD23 | TaperCamD20-15-UCD23-1310 System-TaperCamD20-15-UCD23-1310 | TaperCamD20-15-UCD23-NIR System-TaperCamD20-15-UCD23-NIR |
相机式光束质量分析仪附件
 Filters/Samplers/Attenuators |  Lenses/Optics |  Translation Stages/Hardware |
 UV/IR Converters |  Replacement Detectors |  Replacement Cables |
 Manuals |
狭缝扫描式光束质量分析仪
Slit Scan Beam Profilers
Beam'R2系列
 Beam'R2-S System-BR2-Si | Beam'R2-InGaAs System-BR2-IGA |  Beam'R2-DD Si/InGaAs (190-1750 nm) System-BR2-DD |
| Beam'R2-DD Si/InGaAs (190-2300 nm) System-BR2-DD-2300 | Beam'R2-DD Si/InGaAs (190-2500 nm) System-BR2-DD-2500 |
BeamMap2 4XY/3XYKE系列
BeamMap2-4XY-Si System-BMS2-4XY-Si | BeamMap2-4XY-InGaAs System-BMS2-4XY-IGA | BeamMap2-4XY-DD Si/InGaAs System-BMS2-4XY-DD |
BeamMap2-3XYKE-Si System-BMS2-3XYKE-Si | BeamMap2-3XYKE-InGaAs System-BMS2-3XYKE-IGA | BeamMap2-3XYKE-DD Si/InGaAs System-BMS2-3XYKE-DD |
BeamMap2 ColliMate系列
 BeamMap2-CM4-Si System-BMS2-CM4-Si | BeamMap2-CM4-InGaAs> System-BMS2-CM4-IGA |  BeamMap2-CM4-DD Si/InGaAs System-BMS2-CM4-DD |
BeamMap2-CM3-Si System-BMS2-CM3-Si | BeamMap2-CM3-InGaAs System-BMS2-CM3-IGA | BeamMap2-CM3-DD Si/InGaAs System-BMS2-CM3-DD |
BeamScope-P8 系列
 BeamScope-P8-Si System-BSC-P8-Si | BeamScope-P8-Ge System-BSC-P8-Ge | BeamScope-P8-InAs System-BSC-P8-IA |
BeamScope-P8-Si, extended probe head System-BSC-P8-Si-EPH |  BeamScope-P8-Ge, extended probe head System-BSC-P8-Ge-EPH | BeamScope-P8-InAs, extended probe head System-BSC-P8-IA-EPH |
狭缝扫描式光束质量分析仪附件
Samplers/Attenuators | Lenses/Optics> |  Translation Stages/Hardware |
 BeamScope Slits/Pinholes |  True2D Sapphire Slits | Replacement Cables |
 Manuals |
