N5225A 10 MHz to 50 GHz
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关键产品信息
查看此产品的详细功能。
技术指标
- Data Sheet and Technical Specifications, N5224A and N5225A 2-Port and 4-Port PNA Network Analyzers
- Keysight Spectrum Analysis for PNA/PNA-L/PNA-X/N5290A/N5291A
- Data Sheet and Technical Specifications, N5224A and N5225A PNA Network Analyzers Option 210 and 410
- 更多
手册
- Service Guide - N5224A & N5225A 2-Port and 4-Port PNA Microwave Network Analyzers
- Keysight Technologies 2-port/4-port N522xA to N522xB PNA Model Upgrade Kit
- Installation Note, Add Bias Tees Upgrade Kit to Upgrade N5224A or N5225A Option 417 to 419
- 更多
手册和竞争力概览
- PNA and PNA-X Series Vector Network Analyzers (VNAs) - Option 090 Product Fact Sheet
- 是德科技PNA和PNA-L系列微波网络分析仪
- Keysight PNA-B 系列微波网络分析仪
- 更多
选择与配置指南
- PNA Family Microwave Network Analyzers (N522x/3x/4xA) - Configuration Guide
演示
- PNA 帮助与编程指南推介 –– 部分
- How to Connect an iPad to a PNA
- Watch the new PNA video on Engineering TV from IMS 2011
支持文档
探讨此产品如何应对特定的测量挑战。
- 应用说明
- 解决方案概述
- 文章和案例分析
| 是德科技 矢量网络分析的基本原理 是德科技 矢量网络分析的基本原理 |
| 网络分析的基础知识 - 网络分析仪的体系结构（AN 1287-2） 本应用指南介绍了网络分析仪已经成为高频元器件和设备进行性能表征的重要工具之一。 |
| Applying Error Correction To Vector Network Analyzer Measurements - Application Note Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results. |
| 是德科技网络分析仪测量：滤波器和放大器示例 是德科技网络分析仪测量：滤波器和放大器示例 |
| Network Analysis - In-Fixture Measurements (1287-9) |
| Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10) Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-bａnd response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the... |
| Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file. |
| 了解和改善 网络分析仪的动态范围 了解和改善 网络分析仪的动态范围 |
| Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1) At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging). |
| 微波PNA系列网络分析仪应用指南1408-1 |
| Mixer Conversion-Loss and Group-Delay Meas. Techniques and Comparisons (1408-02) – Application Note This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer. |
| 是德科技 使用 PNA 微波网络分析仪中的 频率转换器应用软件改善测量和 校准精度 是德科技 使用 PNA 微波网络分析仪中的 频率转换器应用软件改善测量和 校准精度 |
| 微波PNA系列网络分析仪应用指南1408-7 |
| 微波PNA系列网络分析仪应用指南1408-8 |
| 微波PNA系列网络分析仪应用指南1408-9 |
| PNA微波网络分析仪应用指南1408-10 PNA微波网络分析仪应用指南1408-10 |
| PNA - Pulsed Measurement Accuracy (1408-11) |
| 宽带和窄带法脉冲参数测量 |
| PNA - Analyze Lightwave Components (1408-14) |
| Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note |
| Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements. |
| Measuring Group Delay of Frequency Converters with Embedded LO |
| High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19 This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA). |
| 是德科技使用 PNA-X 系列网络分析仪精确地测量噪声系数 是德科技使用 PNA-X 系列网络分析仪精确地测量噪声系数 |
| Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion. |
| 是德科技 材料介电特性的测量基础 是德科技 材料介电特性的测量基础 |
| Solutions for Active Device Test This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership. |
| On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus. |
| Electronic vs. Mechanical Calibration Kits: Calibration methods and Accuracy – White Paper The purpose of this paper is to clarify the differences between electronic and mechanical calibrations and how these differences affect measurement accuracy. |
| 个性化校准: 新的电子校准特征允许用户按照特殊需要校准 |
| 是德科技 使用网络分析仪进行时域分析 是德科技 使用网络分析仪进行时域分析 |
| 应用指南:高达 67 GHz 的晶圆噪声系数测量优化 应用指南:高达 67 GHz 的晶圆噪声系数测量优化 |
| 频率 | 50 GHz |
|---|---|
| 动态范围 | 127 dB |
| 输出功率 | 13 dBm |
| 内置端口数量 | 2 或 4 端口 |
| 谐波 | -60 dBc |
| 扫描速度可达 201 个点 | 5.5 ms |
| 网络分析仪系列 | PNA 高性能 |
| 元器件 |
|
OPTIONS:
2 ports, single source, base configuration (Option
200)
2-ports, single source, base configuration (Option
200/210)
2 ports, single source, with configurable test set
ａnd source attenuators (Option 216)
2-ports, single source, with extended power range
(Option 217)
2-ports, single source, with extended power range
ａnd bias-tee (Option 219)
4-ports, dual source, base configuration
(Option 400/410)
4-ports, dual source, with configurable test set
(Option 401)
4-ports, dual source, with extended power range
(Option 417)
4-ports dual source, with extended power range
ａnd bias-tee (Option 419)
4 ports, single source, base configuration (Option
400)
4 ports, single source, with configurable test set
ａnd source attenuator (Option 416)
Automatic fixture removal (Option 007)
Time domain (Option 010)
Frequency offset (Option 080)
Scalar-calibrated converter measurements
(Option 082)
Vector- and scalar-calibrated converter
measurements (Option 083)
Embedded LO measurements (Option 084)
Gain compression application (Option 086)
Intermodulation distortion application
(Option 087)
Source phase control (Option 088)
Differential and I/Q devices application (Option 089)
Spectrum analyzer (Option 090)
Extended spectrum analyzer to 110 GHz
(Option 093)
Extended spectrum analyzer above 110 GHz
(Option 094)
Active Hot Parameters (Option 110/111)
Integrated true-mode stimulus application
(Option 460)
N-port capabilities (Option 551)
Noise figure measurements using standard receivers
(Option 028)
Fully-corrected noise figure measurements
(Option 029)
Pulsed-RF measurements (Option 008)
Add IF inputs for antenna and millimeterwave
(Option 020)
Add pulse modulator to internal first source
(Option 021)
Add pulse modulator to internal second source
(Option 022)
Add four internal pulse generators (Option 025)
Fast CW Sweep (Option 118)
Rack mount kit without handles (Option 1CM)
Rack mount kit with handles (Option 1CP)
Pulse I/O adapter (N1966A)
