Features
- Fully automatic, high-speed dc characterization of semiconductor devices
- High resolution, wide range sourcing and measurement. I: 1pA - 100mA, V: 1mV - 100V
- Maximum 1150 measurement and display points for precise measurement and analysis
- Flexible graphic analysis functions for quick parameter extraction
- Built-in micro flexible disc drive for storage of 240 user programs or 105 measurement results
- HP-IB