主要特性与技术指标
支持多频率交流阻抗测量，适用于 CV（电容 – 电压）、C-t（电容 – 时间）和 C-f（电容 – 频率）测量
频率范围是 1 kHz 至 5 MHz，频率分辨率是 1 mHz
SMU 和 SCUU（SMU CMU 统一单元）提供 25 V 内置直流偏置和 100 V 直流偏置
SCUU 支持自动更改连接，以进行快速、精确的 IV 和 CV 测量
信号电平高达 250 mVrms
在 CV、C-f 和 C-t 测量中有 1001 个扫描点
支持的测量：Cp-G、Cp-D、Cp-Q、Cp-Rs、Cs-Rs、Cs-D、Cs-Q、Lp-G、Lp-D、Lp-Q、Lp-Rs、Ls-Rs、Ls-D、Ls-Q、R-X、G-B、Z-θ、Y-θ
描述
通过集成电流-电压（IV）和 CV 测量，可让您对电容-电压（CV）测量结果充满信心
Keysight B1500A 系列中的 Keysight B1520A 多频率电容测量单元（MFCMU）拥有是德多年以来的 LCR 仪表技术和知识作为后盾。它将会进一步扩展 Keysight B1500A 半导体器件分析仪的精确电容测量功能。Keysight B1500A 集成了 MFCMU 和电源/测量单元（SMU）的功能，能够执行基本的 IV 测量和多种电容测量，例如 CV、C-t、C-f 和准静态 CV（QS-CV），因而是一款综合的 IV 和 CV 测量解决方案。对于要求进行精密 IV 和 CV 测量的半导体、碳纳米管（CNT）、碳纳米线（CNW）、有源/无源元件、材料以及任意电气器件，B1520A 结合使用 EasyEXPERT 软件的分析和数据管理能力，非常适合对这些器件进行 IV 和 CV 表征。
Main features and technical indicators
Supports multi-frequency ac impedance measurements for CV (capacitance - voltage), c-t (capacitance - time) and c-f (capacitance - frequency) measurements
The frequency range is 1 kHz to 5 MHz, and the minimum frequency resolution is 1 MHz
The SMU and the SCUU (unified unit of the SMU CMU) provide 25 V built-in dc offset and 100 V dc offset
SCUU supports automatic connection changes for quick and accurate IV and CV measurements
The signal level is up to 250 mVrms
There are 1001 scanning points in the CV, c-f and c-t measurements
Measurements supported: cp-g, cp-d, cp-q, cp-rs, cs-rs, cs-d, cs-q, lp-g, lp-d, lp-q, lp-rs, ls-rs, ls-d, ls-q, ls-x, rs-x, g-b, z-r, y-r
describe
The integrated current-voltage (IV) and CV measurements give you confidence in the capacitance voltage (CV) measurements
The Keysight B1520A multi-frequency capacitance measuring unit (MFCMU) in the Keysight B1500A series is backed by years of LCR instrumentation technology and knowledge. It will further extend the precision capacitance measurement capabilities of the Keysight B1500A semiconductor device analyzer. Keysight B1500A integrates MFCMU and power/measurement unit (SMU) functions to perform basic IV measurements and a variety of capacitance measurements such as CV, c-t, c-f, and quasi-static CV (qs-cv) and is therefore a comprehensive IV and CV measurement solution. For semiconductors, carbon nanotubes (CNT), carbon nanowires (CNW), active/passive components, materials, and any electrical device requiring precise IV and CV measurements, B1520A, combined with the analytical and data management capabilities of EasyEXPERT software, is well suited for IV and CV characterization of these devices.
