IMA是一款可收集可见、红外、近红外范围(400-1620nm）光谱和空间信息的高光谱显微镜。该系统能够快速地对光致发光、电致发光、荧光、反射率和透射率进行成像。基于高通量的全局滤波器，IMA比传统的点扫或线扫系统，采集速度更快，效率更高。
技术参数 | 可见光波段 | 近红外波段 |
光谱范围 | 400-1000nm | 900-1620nm |
光谱分辨率（FWHM） | ＜2nm | ＜4nm |
通道类型 | 连续可调 | 连续可调 |
空间分辨率 | 亚微米-与显微镜物镜光阑相关 | 亚微米-与显微镜物镜光阑相关
|
相机 | CCD,EMCCD,sCOMS | Photon公司砷镓铟相机（ZephIR™ 1.7 or Alizé™ 1.7)） |
激发波长（最多三激光） | 405, 447, 532, 561, 660, 730, 785, 808 nm (其他波长可定制) | 405, 447, 532, 561, 660, 730, 785, 808 nm (其他波长可定制) |
显微镜 | 正置、倒置、科研级显微镜 | 正置、倒置、科研级显微镜 |
白光激发 | 透射、反射、汞灯、卤素灯 | 透射、反射、汞灯、卤素灯 |
观测模式 | 荧光、暗场（油镜或干镜） | 荧光、暗场（油镜或干镜） |
应用案例
17-手性半导体单壁碳纳米管的高光谱发光成像表征
高光谱显微镜搭配光学生物传感器检测大肠杆菌浓度
金纳米粒子的高光谱暗场表征:识别和定位
钙钛矿光谱与空间信息分析
多晶铜铟二硫化电池的高光谱发光特性
用砷化镓样品进行法校准模块测试
硅太阳能电池的高光谱发光成像
碳化硅缺陷的高光谱电致发光表征
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