多功能扫描探针显微镜（带纳米力学测试功能）-仪表网

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多功能扫描探针显微镜（带纳米力学测试功能）型号：NT-206，是集多功能于一身的原子力显微镜，带有复杂的硬件与软件分析系统，可分析形貌与力学性能，分辨率为纳米级别

多功能扫描探针显微镜（带纳米力学测试功能）产品详情

多功能扫描探针显微镜（带纳米力学测试功能）型号：NT-206，是集多功能于一身的原子力显微镜，带有复杂的硬件与软件分析系统，可分析形貌与力学性能，分辨率为纳米级别。可添加：纳米压痕、划痕、磨损，附着力、摩擦力测试，纳米光刻等功能。

Positioning probe over journal neck of watch gear

A probe is positioned above journal neck of watch gear

Embedded videosystem in combination with motorized XY micropositioning stage provide convenient tuning of the instrument and its fine targeting onto the features on the sample surface. All that dramatically enhances the instrument's functionality when researching micro- and nanosize objects.

To meet requirements of specific research tasks, AFM NT-206 can include specialized changeable probe holders for microtribometry and adhesiometry or for nanoindentation.

NT-206 ::: Description ::: Features ::: Delivery set ::: Software

多功能扫描探针显微镜（带纳米力学测试功能）技术指标：

Measurement modes: 测量模式： Motion patterns at the measurements: - area (matrix); - line; - single point.	Contact static AFM 接触静态 Lateral force microscopy /with contact static AFM/ 横向力显微镜/用静态接触AFM Non-contact dynamic AFM 非接触式动态AFM Intermittent contact AFM (similar to Tapping Mode®) 间隙接触（敲击） Phase contrast imaging /with intermittent contact AFM/ 相衬成像/用间隙接触AFM Two-pass mode (for static and dynamic AFM) 6. 两回合模式（适合静态与动态AFM） Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/两回合模式，伴随变化的间距， Multicycle scanning (for static and dynamic AFM) /Original technique!/多回合扫描（适合静态与动态AFM） Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/多回合扫描，伴随变化的载荷（适合静态与动态AFM） Electrostatic force microscopy (two-pass technique) , 静电力显微镜（双回合技术） Current mode , *电流模式 Magnetic force microscopy (two-pass technique) , 磁力显微镜（双回合技术） Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)静态力谱（在测量点，计算定量参数、表面能与弹性模量） Dynamic force spectroscopy动态力谱 Dynamic frequency force spectroscopy /Original technique!/动态频率力谱 Nanoindentation 纳米压痕* Nanoscratching *纳米划痕 Linear nanowear 线性纳米磨损 Nanolithography (with control of load, depth and bias voltage) 纳米光刻（控制力，深度，偏压） Microtribometry /Original technique!/微观摩擦力计量* Microadhesiometry /Original technique!/微观附着力计量* Shear-force microtribometry /Original technique!/剪切力微观摩擦力计量* Temperature-dependent measurements (under all above modes) 基于温度的测量（适用于所以以上模块）* Note. * - Specialized accessories or rig required*需要特殊的附件或工具 - Specialized probes required 需要特殊的探针
Scan field area:扫描面积	from 5x5 micron up to 50x40 microns
Maximum range of measured heights:高度范围	from 2 to 4 micron
Lateral resolution (plane XY):侧面分辨率	1–5 nm (depending on sample hardness)
Vertical resolution (direction Z):竖直分辨率	0.1–0.5 nm (depending on sample hardness)
Scanning matrix:扫描矩阵	Up to 1024x1024 points
Scan rate:扫描速度	40–250 points per second in X-Y plane
Nonlinearity correction :非线性校正	A software nonlinearity correction provided
Minimum scanning step:最小扫描步阶	0.3 nm
Scanning scheme:扫描步骤	The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe.
Scanner type:扫描器类型	A piezoceramic tube.
Cantilevers (probes):悬臂（探针）	Commercial AFM cantilevers of 3.4x1.6x0.4 mm. Recommended are probes from Mikromasch or NT-MDT. Checked for operation with probes by BudgetSensor and Nanosensors
Cantilever deflection detection system:悬臂倾斜探测系统	Laser beam scheme with four-quadrant position-sensitive photodetector
Sample size:样品尺寸	Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm
High voltage amplifier output: 高压放大器输出	+190 V
ADC:	16 bit
Operation environment:操作环境	Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70%
Range of automated movement of measuring head:测量头自动移动范围	10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring
Overall dimensions:总尺寸	Scanning unit: 185x185x290 mm Control electronic unit: 195x470x210 mm
Field of view of embedded videosystem:植入视频系统的视场	1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps.
Vibration isolation:防震隔离	Additional antivibration table is recommended
Host computer:控制计算机	Not less than: Celeron^®2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows^® XP SP1, 2 USB port. Recommended: Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows^® XP SP2 or higher, 2 free USB port.
Software:软件	Special control software SurfaceScan ａnd the AFM image processing package SurfaceView / SurfaceXplorer are included.

* Before measurements, the probe can be positioned to necessary place over the sample with help of automated motorized stage. To provide monitoring for the scan area and objects below the probe, the instrument embeds a videosystem allowing to watch the probe motion over the sample surface. Videosystem and the motorized stage for the probe positioning over sample are included in base set by default. A combination of these two options allows rather flexible selection of objects to be measured on the sample surface at direct visual monitoring by the opeartor.

多功能扫描探针显微镜（带纳米力学测试功能）组成模块：

DELIVERY SET

NT-206 ::: Description ::: Features ::: Delivery set ::: Software

::: BASIC SET
	Scanning unit (atomic force microscope) Includes a base platform with embedded XY positioning stage and a detachable measuring head with integrated video system
	Control electronic unit with the connetcion cables in the set (the case variants)
	Software package including: The software runs under Win32. Supplied on CD. Updates available at this site in section ARCHIVE > SOFTWAREAFM control software SurfaceScan for driving complex and data acqusition and visualization .SurfaceView and SurfaceXplorersoftware package for the measured data processing, visualization and analysis.The software can include plug-ins for processing AFM-data obtained with other microscopes.A set of drivers for connection of control electronic unit with host PC and running videosystem.
Note: ¹ Base set includes also the control software (for Win32) and user manual. 多功能扫描探针显微镜（带纳米力学测试功能）可选配件
::: ADDITIONAL ACCESSORIES (optional)
	A specialized antivibration rack	A changeable probe holder
	Changeable scaners for ranges: 5x5x2 um 10x10x3 um 20x20x3.5 um 40x40x3.5 um 50x50x3.5 um 90x90x3.5 um	Set for scanning the sample emmersed in liquid medium
	Thermocell: a changeable sample platform for measured sample heating up to 150 °С with stand-allone controller	A changeable holder for conducting probes
	Extending block insert allowing measurement of thick samples with height up to 35 mm	A changeable microtribometer-adhesiometer unit
	Option: a set of AFM probes (Prod. by Mikromasch)	A changeable shear-force microtribometer unit
	Option: a set of calibration test gratings (Prod. by Mikromasch)	A changeable nanoindentor unit

多功能扫描探针显微镜（带纳米力学测试功能）软件

SOFTWARE

NT-206 ::: Description ::: Features ::: Delivery set ::: Software

Control software running on 19-inch screen Control software for AFM NT-206 SurfaceScan is a 32-bit Windows application.
It runs under Windows XPsp2/Vista/7 operating systems.

The control software provides all preliminary tunings and settings necessary for the AFM operation: visual control over the laser-beam detection system adjustment, tuning of the cantilever oscillations (in dynamic modes), feed-back system adjusting, sample positioning under the probe and sample approach to the probe before measurements and removal after the measurements. A full-field or any reduced area within the full field of the scanner can be selected for measurements.

Operator can watch any combination of acquired AFM/LFM images in data visualization window or switch to look at them in one window. Additionally, profile of currenly acquired line can be monitored as well.

Acquired data are saved in files of special format that can be then processed, visualised (in 2-D and 3-D presentation) and analysed with a specialized software package SurfaceView or SurfaceXplorer.

关键词：显微镜弹性模量

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